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Angela Duparre
 
1. Advanced Characterization Techiniques for Optics, Semiconductors, and Nanotechnologies: 3-5 August 2003 San Diego, California, USA
ISBN: 9780819450616 - Paperback - List Price: $90.00
Publisher: Society of Photo Optical - Published Date: 11/01/2003 - Paperback
Editor: Angela Duparre
Editor: Bhanwar Singh

2. Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components
ISBN: 9780819445469 - Paperback - List Price: $80.00
Publisher: Society of Photo Optical - Published Date: 11/11/2002 - Paperback
Author: Angela Duparre
Editor: Bhanwar Singh

3. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
ISBN: 9780819468208 - Paperback - List Price: $80.00
Publisher: Society of Photo Optical - Published Date: 09/10/2007 - Paperback
Editor: Bhanwar Singh
Editor: Angela Duparre
Editor: Zu-Han Gu

4. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
ISBN: 9780819458834 - Paperback - List Price: $105.00
Publisher: Society of Photo Optical - Published Date: 08/18/2005 - Paperback
Author: Angela Duparre
Editor: Bhanwar Singh
Editor: Zu-Han Gu

5. Optical Fabrication, Testing, and Metrology II
ISBN: 9780819459831 - Paperback - List Price: $140.00
Publisher: Society of Photo Optical - Published Date: 10/13/2005 - Paperback
Author: Angela Duparre
Editor: Lingli Wang
Editor: Roland Geyl

6. Optical Fabrication, Testing, and Metrology III
ISBN: 9780819473325 - Paperback - List Price: $105.00
Publisher: Society of Photo Optical - Published Date: 09/16/2008 - Paperback
Editor: Angela Duparre
Editor: Roland Geyl

7. Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries
ISBN: 9780819437440 - Paperback - List Price: $80.00
Publisher: Society of Photo Optical - Published Date: 11/02/2000 - Paperback
Author: Bhanwar Singh
Author: Angela Duparre
Author: Society of Photo-Optical Instrumentation Engineers


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