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IEEE Malaysia Section
1. Third IEEE International Workshop on Electronic Design, Test, and Applications :Proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia: Proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
Author: Patrick Girard - Author: Monash University Malaysia - Author: IEEE Computer Society - Author: IEEE Malaysia Section - Author: National Instruments (Firm) - Author: Adam Osseiran
ISBN: 0769525008
ISBN13: 9780769525006
Binding: Book
Publisher: IEEE Computer Society
Published Date: 01/01/2006