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National Instruments
1. Fourth IEEE International Symposium on Electronic Design, Test and Applications :Proceedings :[Delta]'08 :23-25 January 2008, SAR, China: Proceedings [Delta]'08 23-25 January 2008, SAR, China
ISBN: 9780769531106 - Book
Publisher: IEEE Computer Society - Published Date: 01/01/2008 - Book
Author: IEEE Computer Society
Author: IEEE Hong Kong Section Electron Devices Society
Author: Adam Osseiran
Author: Chinese University of Hong Kong
Author: National Instruments
Author: Hong Ko

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