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Alberto Bosio
1.
Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author:
Patrick Girard
-
Author:
Alberto Bosio
-
Author:
Luigi Dilillo
ISBN:
1441909370
ISBN13:
9781441909374
Binding:
Hardcover
List Price:
$139.0
Publisher:
Springer Verlag
Published Date:
06/01/2009
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