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Kevin M. Monahan
1. Integrated Circuit Metrology, Inspection, and Process Control III: 27-28 February 1989, Los Angeles, California
Editor: Kevin M. Monahan
ISBN: 0819401226
ISBN13: 9780819401229
Binding: Paperback
List Price: $65.0
Publisher: Society of Photo Optical
Published Date: 07/01/1989
2. Handbook of Critical Dimension Metrology and Process Control: Proceedings of a Conference Held 28-29 September 1993 Monterey, California
Author: Society of Photo-Optical Instrumentation Engineers - Author: Kevin M. Monahan - Editor: Kevin M. Monahan
ISBN: 0819413631
ISBN13: 9780819413635
Binding: Hardcover
List Price: $86.0
Publisher: Society of Photo Optical
Published Date: 07/01/1994
3. Cost and Performance in Integrated Circuit Creation
Author: Alfres K. K. Wong - Editor: Alfred Kwok-Kit Wong - Editor: Kevin M. Monahan
ISBN: 0819448486
ISBN13: 9780819448484
Binding: Paperback
List Price: $70.0
Publisher: Society of Photo Optical
Published Date: 07/01/2003