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Fred H. Pollak
 
1. Diagnostic Techniques for Semiconductor Materials Processing II: Symposium Held November 27-30, 1995, Boston, Massachusetts, U.S.A
ISBN: 9781558993099 - Hardcover - List Price: $67.00
Publisher: Materials Research Society - Published Date: 04/01/1996 - Hardcover
Editor: Francis G. Celii
Editor: Stella W. Pang
Editor: Clivia M. Sotomayor Torres
Editor: Orest J. Glembocki
Editor: Fred H. Pollak

2. International Conference on Modulation Spectroscopy: 19-21 March 1990, San Diego, California
ISBN: 9780819403377 - Paperback - List Price: $70.00
Publisher: Society of Photo Optical - Published Date: 12/01/1990 - Paperback
Author: Fred H. Pollak
Author: Manuel Cardona
Author: Society of Vacuum Coaters
Author: David E. Aspnes
Author: Society of Photo-Optical Instrumentation Engineers
Author: International Conference

3. Layered Structures: Heteroepitaxy, Superlattices, Strain and Metastability Symposium Held November 27-December 1, 1989, Boston, Massachusetts, U.S.
ISBN: 9781558990487 - Hardcover - List Price: $17.50
Publisher: Materials Research Society - Published Date: 04/01/1990 - Hardcover
Author: B.W. Dodson
Author: Fred H. Pollak
Author: J.E. Cunningham
Author: L.J. Schowalter

4. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices
ISBN: 9780892528295 - Paperback - List Price: $50.00
Publisher: Society of Photo Optical - Published Date: 06/01/1987 - Paperback
Author: Fred H. Pollak
Author: O.J. Glembocki
Editor: Jae Jung Song


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