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Patrick Girard
 
1. Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
ISBN: 9781441909374 - Hardcover - List Price: $139.00
Publisher: Springer Verlag - Published Date: 06/01/2009 - Hardcover
Author: Patrick Girard
Author: Alberto Bosio
Author: Luigi Dilillo

2. Power-aware Testing and Test Strategies for Low Power Devices
ISBN: 9781441909275 - Hardcover - List Price: $139.00
Publisher: Springer Verlag - Published Date: 10/22/2009 - Hardcover
Editor: Patrick Girard
Editor: Nicola Nicolici
Editor: Xiaoqing Wen

3. Tarik o la conquista de Ala/ Tarik or the Conquest of Ala
ISBN: 9788498771800 - Hardcover - List Price: $32.95
Publisher: Algaida Editores - Published Date: 01/20/2009 - Hardcover
Author: Patrick Girard
Translator: Elena Bernardo

4. Third IEEE International Workshop on Electronic Design, Test, and Applications :Proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia: Proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
ISBN: 9780769525006 - Book
Publisher: IEEE Computer Society - Published Date: 01/01/2006 - Book
Author: Patrick Girard
Author: Monash University Malaysia
Author: IEEE Computer Society
Author: IEEE Malaysia Section
Author: National Instruments (Firm)
Author: Adam Osseiran


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