Home Book reviews
Used Book Memo Saved Search New Book Memo
Contact
☰

Aland K. Chin
1. Testing Reliability and Application: 24-26 January, 2001, San Jose, California USA
Editor: Aland K. Chin
ISBN: 0819439630
ISBN13: 9780819439635
Binding: Paperback
List Price: $80.0
Publisher: Society of Photo Optical
Published Date: 05/01/2001
2. Test and Measurement Applications of Optoelectronic Devices
Author: Aland K. Chin - Editor: Niloy K. Dutta - Editor: Daniel J. McGraw - Editor: Kurt J. Linden - Editor: Robert W Herrick
ISBN: 0819443875
ISBN13: 9780819443878
Binding: Paperback
List Price: $70.0
Publisher: Society of Photo Optical
Published Date: 04/16/2002
[Privacy policy]
Copyright © 1998-, Addall.com Pte Ltd. All rights reserved.