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Massimo Piccoli
1.
Microelectronic Manufacturing Yield, Reliability and Failure Analysis: 25-26 October 1995, Austin, Texas
Author:
Society of Photo-Optical Instrumentation Engineers
-
Editor:
Massimo Piccoli
-
Editor:
Gopal K. Rao
ISBN:
0819420018
ISBN13:
9780819420015
Binding:
Paperback
List Price:
$66.0
Publisher:
Society of Photo Optical
Published Date:
09/01/1995
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