AddALL.com - Icmts 1996: 1996 IEEE International Conference on Microelectronic Test Structures : Mar 25-28, 1996 : Trento, Italy : Proceedings 0780327837 9780780327832

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Icmts 1996: 1996 IEEE International Conference on Microelectronic Test Structures : Mar 25-28, 1996 : Trento, Italy : Proceedings
by Italy) IEEE International Conference on Microelectronic Test Structures (1996 : Trento
Binding: Paperback, 313 pages
Publisher: Institute of Electrical & Electronics Enginee
List Price: USD $106.00
Weight: 210
Dimension: H: 0.75 x L: 11.75 x W: 0.52 inches
ISBN 10: 0780327837
ISBN 13: 9780780327832
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Book Description:
This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.

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