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Reliability Physics Symposium, 1998 IEEE International
by IEEE
Binding: Paperback, 400 pages
Publisher: Institute of Electrical & Electronics Enginee
List Price: USD $138.00
ISBN 10: 0780344006
ISBN 13: 9780780344006
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Book Description:
The IRPS deals with physical mechanisms that reduce the reliability or performance of integrated circuits and microelectronics derived in the user's environment. This conference covers the identification of new microelectronic failure or degradation mechanisms.' 'Advanced Semiconductor Devices; Failure and Yield Enhancement Analysis; Device Dielectrics; Channel Hot Carriers; ESD and Latchup; Assembly and Packaging; Non Silicon Device Reliability; Device and Process' 'Reliability and Quality

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