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2000 IEEE International Conference on Microelectronic Structures
by California) IEEE International Conference on Microelectronic Test Structures (2000 : Monterey
Binding: Hardcover, Mfche edition
Publisher: IEEE Standards Office
List Price: USD $136.00
ISBN 10: 0780362772
ISBN 13: 9780780362772
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Book Description:
These conference proceedings cover such topics as: CD meteorology; device characterization; yield and interconnects; poster session; matching; reliability; parameter extraction; and process characterization.

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