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2001 IEEE International Reliability Physics Symposium Proceedings: 39th Annual Orlando, Florida; April 30 - May 3, 2001
by
Binding: Paperback, 474 pages
Publisher: Ieee
List Price: USD $174.00
Weight: 200
Dimension: H: 0.9 x L: 10.8 x W: 8.4 inches
ISBN 10: 0780365879
ISBN 13: 9780780365872
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Book Description:
Based on a reliability physics symposium, this CD ROM covers topics including: device and process; device dielectrics; assembly and packaging; channel hot carriers; interconnects; ESD and latch up; process induced damage; failure analysis; reliability; and optoelectronic emitters and detectors.

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