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IEEE Vlsi Test Symposium: Proceedings : 30 Spril - 4 May 2000 Montreal, Quebec, Canada
by
Binding: Paperback, 18 edition, 500 pages
Publisher: Institute of Electrical & Electronics Enginee
Weight: 2.65 pound
Dimension: H: 0.75 x L: 10.5 x W: 0.59 inches
ISBN 10: 0769506135
ISBN 13: 9780769506135
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Book Description:
These papers constitute the proceedings of the IEEE VLSI Test Symposium 2000. Subjects covered include: microprocessor test/validation; low power BIST and scan; defect driven techniques; analogue test techniques; temperature and process drift issues; and more.


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