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Defect and Fault Tolerance in Vlsi Systems (Dft 2000): 2000 IEEE International Symposium
Binding: Paperback, 2000 edition, 438 pages
Publisher: Institute of Electrical & Electronics Enginee
Weight: 1.3 pound
Dimension: H: 1 x L: 8.75 x W: 6 inches
ISBN 10: 0769507190
ISBN 13: 9780769507194
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Book Description:
This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault tolerant systems; tesitng strategies; and more.

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