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Proceedings of the Ninth Asian Test Symposium (Ats 2000)
Binding: Paperback, 480 pages
Publisher: Ieee
Weight: 2.5 pound
Dimension: H: 1 x L: 10.25 x W: 8.25 inches
ISBN 10: 0769508871
ISBN 13: 9780769508870
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Book Description:
These conference proceedings cover such topics as: analogue and mixed signal tests; memory built in self test and self diagnosis; fault simulation and timing simulation; fault analysis; test generation; functional testing; and memory testing.

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