Don't forget to bookmark this web site !!
Used & Out of Print Books | Contact us | Home

Browse and Compare Price at 40+ Sites and 20,000+ Stores!!

|  FAQ/About us |  Recommend us |  Browse |  Memo |  Book Reviews |  Random Quotes |  Help |


Find more info., search and price compare for
Vlsi Test Symposium (Vts 2001): 19th IEEE Symposium
by India) International Conference on VLSI Design (14th : 2001 : Bangalore
Binding: Paperback, 414 pages
Publisher: Institute of Electrical & Electronics Enginee
Weight: 2.25 pound
Dimension: H: 1 x L: 10.5 x W: 8.25 inches
ISBN 10: 0769511228
ISBN 13: 9780769511221
Click here to search for this book and compare price at 40+ bookstores with!

If you cannot find this book in our new and in print search, be sure to try our used and out of print search too!


Book Description:
Topics include: BIST techniques; diagnosis methods; test data compression; synthesis and design for testability; diagnosis and verification ATPG; defect analysis and IDDx diagnosis; SoC testing; self test techniques; memory diagnosis; novel ATPG techniques; fault modelling and BIST evaluation.

|  Home |  FAQ/About us |  Link to us |  Recommend us |  Contact us |  Bookstores |  Memo |

Shipping Destination:
(US only)
Display in:
Search by:

Searching for Out of Print Books? [Click Here]

[ For web hosting, AddALL recommend Liquidweb]