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The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings : November 13-15, 1995 Lafayette, Louisiana
Binding: Hardcover, 305 pages
Publisher: IEEE Computer Society Press
Weight: 1.35 pound
Dimension: H: 1 x L: 9.5 x W: 6.5 inches
ISBN 10: 0818671076
ISBN 13: 9780818671074
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