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1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems: October 20-22, 1997 Paris, France
Binding: Paperback, 314 pages
Publisher: Institute of Electrical & Electronics Enginee
Weight: 0.95 pound
Dimension: H: 0.75 x L: 8.75 x W: 0.49 inches
ISBN 10: 0818681683
ISBN 13: 9780818681684
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