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1998 International Symposium on Defect and Fault-Tolerance in Vlsi Systems, Dft '98
by
Binding: Paperback, 325 pages
Publisher: Institute of Electrical & Electronics Enginee
Weight: 0 pound
ISBN 10: 0818688327
ISBN 13: 9780818688324
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Book Description:
This volume covers topics including: yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault tolerant designs; high level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.


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