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Mems Reliability for Critical and Space Applications: 21-22 September 1999 Santa Clara, California (Proceedings of Spie, Volume 3880)
by Solid State Technology (Organization)
Binding: Paperback, 176 pages
Publisher: Society of Photo Optical
Weight: 1 pound
Dimension: H: 0.75 x L: 10.5 x W: 0.6 inches
ISBN 10: 0819434779
ISBN 13: 9780819434777
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