Browse and Compare Price at 40+ Sites and 20,000+ Stores!!
|| FAQ/About us | Recommend us | Browse | Memo | Book Reviews | Random Quotes | Help ||
Find more info., search and price compare for |
Engineering Thin Films with ion Beams, Nanoscale Diagnostics and Molecular Manufacturing (SPIE proceedings series)
by Emile J Knystautas ; Wiley P Kirk ; Valerie Browning
Binding: Paperback, 202 pages
Publisher: SPIE-International Society for Optical Engine
Weight: 1.05 pound
Dimension: H: 0.5 x L: 10.6 x W: 8.3 inches
ISBN 10: 0819441821
ISBN 13: 9780819441829
Click here to search for this book and compare price at 40+ bookstores with AddALL.com!
If you cannot find this book in our new and in print search, be sure to try our used and out of print search too!
[ For web hosting, AddALL recommend Liquidweb]