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Materials Science and Technology: A Comprehensive Treatment, Vol. 2B, Characterization of Materials, Pt. II
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Binding: Paperback, 776 pages
Publisher: Wiley-VCH
List Price: USD $495.00
Weight: 344
Dimension: H: 0.75 x L: 9.72 x W: 0.54 inches
ISBN 10: 3527282653
ISBN 13: 9783527282654
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Book Description:
This is the second of two volumes focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics. From the Contents: DiNardo: Scanning Tunneling Microscopy. De Batist: Mechanical Spectroscopy. Castle/Baker: Auger Electron Microscopy. Briggs: Quantitative Acoustic Microscopy. Exner: Quantitative Analysis of Microstructure. Lifshin: Electron Microprobe Analysis. Ma/Zhang/Chu/Liu: High Energy Ion Beam Analysis Techniques. Cerezo/Smith: Field Ion Microscopy and the Position Sensitive Atom Probe. Von Dreele: Neutron Diffraction. May/Williams/Guinier: Small Angle Scattering of X Rays and Neutrons

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